Download Electron Microprobe Analysis and Scanning Electron by S. J. B. Reed PDF

By S. J. B. Reed

Covers rules and methods of EMPA and SEM for geological graduate scholars and postdoctoral staff.

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Extra info for Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

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7 Beam scanning 29 backscattering. This may be mounted on the specimen holder or, more conveniently, on a retractable arm (a standard feature of EMPs, but not SEMs). 4, there is a direct relationship between the strength of the condenser lenses and the beam current. The required current may therefore be obtained by adjustment of the condenser lenses, which, in a computercontrolled instrument with current monitoring, can be done automatically by means of a software command. ) Drift in beam current as a function of time is caused mainly by movement of the tip of the filament, which can be corrected using beam alignment coils (as discussed in the previous section).

However, using an electron microprobe or SEM equipped with a CL detector as described above enables a lower current to be used, with less risk of damage to the specimen; also higher resolution and magnification are available. In addition, weaker CL emission and a wider range of wavelengths (extending beyond the visible region) can be detected, though the capabilities of the CL microscope can be enhanced by using a sensitive CCD camera in place of film. 4. Electron beam Polepiece Phosphor screen BS electrons Camera Specimen Forescatter detector Fig.

Lenses produce a demagnified image of the electron source; aperture diaphragms intercept the unwanted part of the beam. electromagnetic field is contained within the iron except where there is a gap, in the region of which the field on the axis rises sharply to a peak. Interaction with this field causes electrons to be deflected towards the axis, giving properties analogous to those of convex glass lenses used for focussing light. The strength of the lens can be controlled by varying the current in the coil.

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